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零件编号 | 制造商 | 描述 | 库存 |
SN74BCT8244ADW D# V36:1790_07335369 |
Texas Instruments |
Scan Test Device RoHS: Compliant
|
0 |
零件编号 | 制造商 | 描述 | 库存 |
SN74BCT8244ADWE4 |
Texas Instruments |
IC SCAN TEST DEVICE BUFF 24-SOIC |
0 |
SN74BCT8244ADW |
Texas Instruments |
IC SCAN TEST DEVICE BUFF 24-SOIC |
0 |
零件编号 | 制造商 | 描述 | 库存 |
SN74BCT8244ADW |
Texas Instruments |
Scan Test DeviceWithBuffers SOIC-24 74 Series RoHS |
11 |
零件编号 | 制造商 | 描述 | 库存 |
SN74BCT8244ADW D# 296-47718-ND |
Texas Instruments |
IC SCAN TEST DEVICE BUFF 24-SOIC |
86 |
零件编号 | 制造商 | 描述 | 库存 |
SN74BCT8244ADW |
Texas Instruments |
In stock shipping within 2days |
364 |
零件编号 | 制造商 | 描述 | 库存 |
SN74BCT8244ADW D# 3121022 |
Texas Instruments |
LOGIC, SCAN TEST DEVICE BUFF, 24SOIC RoHS: Compliant
Min Qty: 1
Container: Each
|
21 |
零件编号 | 制造商 | 描述 | 库存 |
SN74BCT8244ADW |
OEM/CM QUOTES ONLY | NO BROKERS |
2929 | |
SN74BCT8244ADWE4 |
Texas Instruments |
OEM/CM QUOTES ONLY | NO BROKERS |
434 |
零件编号 | 制造商 | 描述 | 库存 |
SN74BCT8244ADWE4 |
Texas Instruments |
OEM/CM ONLY |
1003 |
SN74BCT8244ADW |
Texas Instruments |
OEM/CM ONLY |
504 |
零件编号 | 制造商 | 描述 | 库存 |
SN74BCT8244ADW D# C362443 |
Texas Instruments | 11 |
零件编号 | 制造商 | 描述 | 库存 |
SN74BCT8244ADW |
Texas Instruments |
OEM/CM Immediate delivery |
1325 |
零件编号 | 制造商 | 描述 | 库存 |
SN74BCT8244ADWE4 D# NS-SN74BCT8244ADWE4 |
Texas Instruments |
OEM/CM ONLY |
1575 |
SN74BCT8244ADW D# NS-SN74BCT8244ADW |
Texas Instruments |
OEM/CM ONLY |
4288 |
零件编号 | 制造商 | 描述 | 库存 |
SN74BCT8244ADW |
Texas Instruments |
BCT/FBT SERIES, DUAL 4-BIT BOUNDARY SCAN DRIVER, TRUE OUTPUT, PDSO24 |
124 |
SN74BCT8244ADWE4 |
Texas Instruments | 292 |
零件编号 | 制造商 | 描述 | 库存 |
SN74BCT8244ADW |
Texas Instruments |
SN74BCT8244A IEEE Std 1149.1 (JTAG) Boundary-Scan Test Device With Octal Buffers RoHS: Compliant
|
47 |
零件编号 | 制造商 | 描述 | 库存 |
SN74BCT8244ADW |
Texas Instruments |
OEM/CM ONLY |
2477 |
SN74BCT8244ADWE4 |
Texas Instruments |
OEM/CM ONLY |
381 |
零件编号 | 制造商 | 描述 | 库存 |
SN74BCT8244ADW |
Texas Instruments |
IN stock Immediate delivery |
1340 |
零件编号 | 制造商 | 描述 | 库存 |
SN74BCT8244ADW |
Texas Instruments |
IEEE Std 1149.1 (JTAG) Boundary-Scan Test Device With Octal Buffers |
3 |
零件编号 | 制造商 | 描述 | 库存 |
SN74BCT8244ADW |
mfr |
RFQ |
6929 |
SN74BCT8244ADWE4 |
Texas Instruments |
RFQ |
2938 |
零件编号 | 制造商 | 描述 | 库存 |
SN74BCT8244ADW D# 3121022 |
Texas Instruments |
LOGIC, SCAN TEST DEVICE BUFF, 24SOIC RoHS: Compliant
Min Qty: 1
Container: Each
|
21 |
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