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零件编号 | 制造商 | 描述 | 库存 |
SN74BCT8374ADW D# V36:1790_07335374 |
Texas Instruments |
Scan Test Device RoHS: Compliant
|
0 |
零件编号 | 制造商 | 描述 | 库存 |
SN74BCT8374ADW |
Texas Instruments | 30 |
零件编号 | 制造商 | 描述 | 库存 |
SN74BCT8374ADW |
Texas Instruments |
SCAN TEST DEVICE, D-FLIP FLOP SOIC24, Flip-Flop Type:D, Propagation Delay:6.7ns, Supply Voltage Min:4.5V, Supply Voltage Max:5.5V, Logic Case Style:SOIC, No. of Pins:24, Frequency:70MHz, Output Current:64mA, Packaging:Each , RoHS Compliant: Yes |
0 |
SN74BCT8374ADWRG4 |
Texas Instruments |
IC SCAN TEST DEVICE 24SOIC |
0 |
SN74BCT8374ADWRE4 |
Rochester Electronics LLC |
74BCT8374 Flip Flop SN74BCT8374ADWRE4 |
0 |
SN74BCT8374ADWR |
Texas Instruments |
N/A BCT/FBT SERIES, 8-BIT BOUNDARY SCAN DRIVER, TRUE OUTPUT, PDSO24 PLASTIC, SO-24 |
1000 |
零件编号 | 制造商 | 描述 | 库存 |
SN74BCT8374ADWR D# SN74BCT8374ADWR-ND |
Texas Instruments |
IC SCAN TEST DEVICE W/FF 24-SOIC |
0 |
SN74BCT8374ADWRE4 D# SN74BCT8374ADWRE4-ND |
Texas Instruments |
IC SCAN TEST DEVICE W/FF 24-SOIC |
0 |
SN74BCT8374ADWRG4 D# SN74BCT8374ADWRG4-ND |
Texas Instruments |
IC SCAN TEST DEVICE 24SOIC |
0 |
SN74BCT8374ADW D# 296-33849-5-ND |
Texas Instruments |
IC SCAN TEST DEVICE W/FF 24-SOIC |
75 |
零件编号 | 制造商 | 描述 | 库存 |
SN74BCT8374ADW |
OEM/CM QUOTES ONLY | NO BROKERS |
3154 | |
SN74BCT8374ADWR |
OEM/CM QUOTES ONLY | NO BROKERS |
2378 |
零件编号 | 制造商 | 描述 | 库存 |
SN74BCT8374ADWR |
Texas Instruments |
OEM/CM ONLY |
1060 |
SN74BCT8374ADW |
Texas Instruments |
OEM/CM ONLY |
862 |
SN74BCT8374ADWR00 |
Texas Instruments |
OEM/CM ONLY |
536 |
SN74BCT8374ADWRE4 |
Texas Instruments |
OEM/CM ONLY |
306 |
零件编号 | 制造商 | 描述 | 库存 |
SN74BCT8374ADW D# 595-SN74BCT8374ADW |
Texas Instruments |
Specialty Function Logic Device w/Octal D-Typ Edge-Trig Flip-Flop RoHS: Compliant
|
104 |
零件编号 | 制造商 | 描述 | 库存 |
SN74BCT8374ADWR D# NS-SN74BCT8374ADWR |
Texas Instruments |
OEM/CM ONLY |
5215 |
SN74BCT8374ADWRE4 D# NS-SN74BCT8374ADWRE4 |
Texas Instruments |
OEM/CM ONLY |
1821 |
SN74BCT8374ADWRG4 D# NS-SN74BCT8374ADWRG4 |
Texas Instruments |
OEM/CM ONLY |
5376 |
SN74BCT8374ADW D# NS-SN74BCT8374ADW |
Texas Instruments |
OEM/CM ONLY |
5626 |
零件编号 | 制造商 | 描述 | 库存 |
SN74BCT8374ADWR |
Texas Instruments |
OEM/CM ONLY |
3020 |
SN74BCT8374ADW |
Texas Instruments |
OEM/CM ONLY |
3797 |
零件编号 | 制造商 | 描述 | 库存 |
SN74BCT8374ADW |
Texas Instruments |
Scan Test Device With Octal D-Type Edge-Triggered Flip-Flops |
996 |
零件编号 | 制造商 | 描述 | 库存 |
SN74BCT8374ADW |
Texas Instruments |
shipping today |
3009 |
零件编号 | 制造商 | 描述 | 库存 |
SN74BCT8374ADW |
Texas Instruments |
RFQ |
9504 |
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